发明名称 Manufacturing method of semiconductor device
摘要 A depression 22 is formed from a first surface 20 of a semiconductor substrate 10 on which is formed an integrated circuit 12. An insulating layer 28 is provided on the inner surface of the depression 22. A first conductive portion 30 is provided on the inside of the insulating layer 28. A second conductive portion 32 is formed on the inside of the insulating layer 28 and over the first conductive portion 30, of a different material from the first conductive portion 30. The first conductive portion 30 is exposed from a second surface 38 of the semiconductor substrate 10 opposite to the first surface 20. <IMAGE>
申请公布号 EP1391923(B1) 申请公布日期 2012.05.09
申请号 EP20030710424 申请日期 2003.03.19
申请人 SEIKO EPSON CORPORATION 发明人 MIYAZAWA, IKUYA
分类号 H01L21/768;H01L21/78;H01L23/31;H01L23/48;H01L23/485;H01L25/065;H01L27/00 主分类号 H01L21/768
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