发明名称 A METHOD FOR MANUFACTURING A SEMICONDUCTOR DEVICE
摘要 <p>PURPOSE: A semiconductor device manufacturing method is provided to supply a semiconductor device with good electrical features and high reliability. CONSTITUTION: A first insulating film(102) includes silicon, nitrogen, and oxygen. A second insulating film includes silicon and oxygen on the first insulating film. The first insulating film is heated to eliminate at least a part of hydrogen from the first insulating film. An oxide semiconductor film(111) is formed on the second insulating film after the insulating film is heated.</p>
申请公布号 KR20120044946(A) 申请公布日期 2012.05.08
申请号 KR20120007203 申请日期 2012.01.25
申请人 SEMICONDUCTOR ENERGY LABORATORY CO., LTD. 发明人 YAMAZAKI SHUNPEI;MIYAIRI HIDEKAZU;AKIMOTO KENGO;SHIRAISHI KOJIRO
分类号 G02F1/1368;H01L29/786 主分类号 G02F1/1368
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