发明名称 |
A METHOD FOR MANUFACTURING A SEMICONDUCTOR DEVICE |
摘要 |
<p>PURPOSE: A semiconductor device manufacturing method is provided to supply a semiconductor device with good electrical features and high reliability. CONSTITUTION: A first insulating film(102) includes silicon, nitrogen, and oxygen. A second insulating film includes silicon and oxygen on the first insulating film. The first insulating film is heated to eliminate at least a part of hydrogen from the first insulating film. An oxide semiconductor film(111) is formed on the second insulating film after the insulating film is heated.</p> |
申请公布号 |
KR20120044946(A) |
申请公布日期 |
2012.05.08 |
申请号 |
KR20120007203 |
申请日期 |
2012.01.25 |
申请人 |
SEMICONDUCTOR ENERGY LABORATORY CO., LTD. |
发明人 |
YAMAZAKI SHUNPEI;MIYAIRI HIDEKAZU;AKIMOTO KENGO;SHIRAISHI KOJIRO |
分类号 |
G02F1/1368;H01L29/786 |
主分类号 |
G02F1/1368 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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