| 摘要 |
A semiconductor device, includes a semiconductor device, a wiring layer provided on the semiconductor substrate, a high frequency wiring provided in the wiring layer, and plural dummy metals provided in the wiring layer apart from the high frequency wiring, wherein the wiring layer in plan view includes a high frequency wiring vicinity region and an external region surrounding the high frequency wiring vicinity region, wherein the high frequency wiring vicinity region includes a first region enclosed by an outer edge of the high frequency wiring, and a second region surrounding the first region, wherein the plural dummy metals are disposed dispersedly in the high frequency wiring vicinity region and in the external region respectively, and wherein an average interval between the dummy metals in the high frequency wiring vicinity region is wider than that in the external region.
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