发明名称 |
Socket connector for connection lead of semiconductor device under test with tester |
摘要 |
A socket connector for electrically connecting a lead of a semiconductor device under test (DUT) with a tester includes a container having a chamber, a conductive end or plug that seals the chamber at one end, and a conductive membrane that seals the chamber at another end. A liquid conductive material fills the chamber. The conductive plug is arranged to be in electrical contact with the tester. The lead of the semiconductor DUT is in electrical contact with the conductive membrane and thus with the tester via the conductive membrane, the liquid conductive material and the conductive plug. |
申请公布号 |
US8174279(B2) |
申请公布日期 |
2012.05.08 |
申请号 |
US20090545074 |
申请日期 |
2009.08.21 |
申请人 |
LEE KOK HUA;LAM ZI YI;PHOON WAI KHUIN;FREESCALE SEMICONDUCTOR, INC. |
发明人 |
LEE KOK HUA;LAM ZI YI;PHOON WAI KHUIN |
分类号 |
G01R31/00;G01R1/067;G01R31/20 |
主分类号 |
G01R31/00 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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