发明名称 Compensation for voltage drop in automatic test equipment
摘要 Providing reliable testing of a device under test (DUT) by compensating for a reduced voltage inside the device without changing the internal circuitry of the device. The DUT has multiple connection terminals for connecting to the test equipment including at least first and second power connection terminals that both connect to an internal power bus of the DUT. An adapter board connects to the multiple connection terminals of the DUT via a removably attachable socket which holds the DUT. A tester supplies power to the DUT through the adapter board. The adapter board is configured to supply power from the tester to the DUT through the first power connection terminal and to monitor voltage at the second power connection terminal. The tester includes a compensation unit which controls power based on the voltage monitored at the second power connection terminal.
申请公布号 US8174277(B2) 申请公布日期 2012.05.08
申请号 US20100815233 申请日期 2010.06.14
申请人 TILBOR ERAN;WEISBLUM MORDECHAY;GRINFELD MICHAEL;MARVELL ISRAEL (M.I.S.L) LTD. 发明人 TILBOR ERAN;WEISBLUM MORDECHAY;GRINFELD MICHAEL
分类号 G01R31/00 主分类号 G01R31/00
代理机构 代理人
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