发明名称 Tire inspection device
摘要 A tire inspection device generates an analyzing wavelet for wavelet transformation correlating time, corresponding to tire surface position, and frequency, based on a frequency representing a characteristic portion of a predetermined tire surface structure. After this, the tire inspection device generates and stores an integer numeric filter from the created analyzing wavelet, detects the tire surface structure, carries out wavelet transformation on a signal obtained by the detection by using the numeric filter as the analyzing wavelet, and outputs the transformation result as the characteristic information representing the characteristic portion.
申请公布号 US8175819(B2) 申请公布日期 2012.05.08
申请号 US20070304380 申请日期 2007.06.13
申请人 FUJISAWA YOSHITAKA;BRIDGESTONE CORPORATION 发明人 FUJISAWA YOSHITAKA
分类号 G01B5/28;B60C19/00;G01B5/30;G01B11/00;G01B11/30;G01M17/02;G01N21/88 主分类号 G01B5/28
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