发明名称 Illumination optical system for microlithography
摘要 The disclosure provides an illumination optical system for microlithography that is designed so that, even with a change of illumination setting (e.g., a change in the given illumination conditions in the object field), variation of illumination parameters over the object field is confined within predetermined tolerances.
申请公布号 US8174677(B2) 申请公布日期 2012.05.08
申请号 US20080233914 申请日期 2008.09.19
申请人 OSSMANN JENS;ENDRES MARTIN;STUETZLE RALF;CARL ZEISS SMT GMBH 发明人 OSSMANN JENS;ENDRES MARTIN;STUETZLE RALF
分类号 G03B27/54;G02B5/08;G03B27/70 主分类号 G03B27/54
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