发明名称 Discrete device testing
摘要 One embodiment in accordance with the invention is a method that comprises testing a first number of physical devices using a first test sequence that comprises an item. A second number of physical devices are tested using a second test sequence. It is noted that the second test sequence comprises the item of the first test and a second item.
申请公布号 US8174779(B2) 申请公布日期 2012.05.08
申请号 US20060591080 申请日期 2006.10.31
申请人 FARREN TERRY;GONG HENG;SHEN YONG;ZHANG JING;HITACHI GLOBAL STORAGE TECHNOLOGIES, NETHERLANDS B.V. 发明人 FARREN TERRY;GONG HENG;SHEN YONG;ZHANG JING
分类号 G11B27/36 主分类号 G11B27/36
代理机构 代理人
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