发明名称 |
Wavelength determining apparatus, method and program for thin film thickness monitoring light |
摘要 |
A multi-layer optical thin film filter comprising plural deposited optical thin films, wherein optical thin film thickness for each of said optical thin films has a predetermined wavelength spectrum in a predetermined gain equalization band and a predetermined wavelength spectrum in a pumping light transmission band other than said gain equalization band. |
申请公布号 |
US8174757(B2) |
申请公布日期 |
2012.05.08 |
申请号 |
US20100843453 |
申请日期 |
2010.07.26 |
申请人 |
ITOH TAKAHIRO;MIMURA YOU;THE FURUKAWA ELECTRIC CO., LTD. |
发明人 |
ITOH TAKAHIRO;MIMURA YOU |
分类号 |
H01S3/00;G01B11/06 |
主分类号 |
H01S3/00 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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