发明名称 Wavelength determining apparatus, method and program for thin film thickness monitoring light
摘要 A multi-layer optical thin film filter comprising plural deposited optical thin films, wherein optical thin film thickness for each of said optical thin films has a predetermined wavelength spectrum in a predetermined gain equalization band and a predetermined wavelength spectrum in a pumping light transmission band other than said gain equalization band.
申请公布号 US8174757(B2) 申请公布日期 2012.05.08
申请号 US20100843453 申请日期 2010.07.26
申请人 ITOH TAKAHIRO;MIMURA YOU;THE FURUKAWA ELECTRIC CO., LTD. 发明人 ITOH TAKAHIRO;MIMURA YOU
分类号 H01S3/00;G01B11/06 主分类号 H01S3/00
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