发明名称 Apparatus and methods for detecting a conductive object at a location
摘要 A method and apparatus to detect a conductive object at a location determines a capacitance variation of a first sensor element and a capacitance variation of a second sensor element. The method and apparatus detects a touch at a first location if the capacitance variation of the first sensor element is greater than a reference value and the capacitance variation of the second sensor element is not greater than the reference value. The method and apparatus detects the touch at a second location if the capacitance variation of the first sensor element is not greater than the reference value and the capacitance variation of the second sensor element is greater than the reference value. The method and apparatus detects the touch at a third location if the capacitance variation of the first sensor element and the capacitance variation of the second sensor element are both greater than the reference value.
申请公布号 US8174507(B2) 申请公布日期 2012.05.08
申请号 US201113204543 申请日期 2011.08.05
申请人 XIAOPING JIANG;CYPRESS SEMICONDUCTOR CORPORATION 发明人 XIAOPING JIANG
分类号 G06F3/041;G06F3/02;G06F3/045;G09G5/00;H03K17/975 主分类号 G06F3/041
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