发明名称 Method of forming pattern and composition for forming of organic thin-film for use therein
摘要 A method for forming a pattern contains (1) a step of forming an underlayer film containing (A) a radiation-sensitive acid generator capable of generating an acid upon exposure to radiation rays or (B) a radiation-sensitive base generator capable of generating a base upon exposure to radiation rays on a substrate; (2) a step of irradiating the underlayer film with radiation rays through a mask with a predetermined pattern to obtain an exposed underlayer film portion having been selectively exposed through the predetermined pattern; (3) a step of forming (C) an organic thin film on the underlayer film so as to attain chemical bonding of the exposed underlayer film portion with the organic thin-film formed on the exposed underlayer film portion; and (4) a step of removing the organic thin film formed on areas of the underlayer film other than the exposed underlayer film portion.
申请公布号 US8173348(B2) 申请公布日期 2012.05.08
申请号 US20070305893 申请日期 2007.06.21
申请人 SHIMIZU DAISUKE;SUGITA HIKARU;MATSUMURA NOBUJI;KAI TOSHIYUKI;SHIMOKAWA TSUTOMU;JSR CORPORATION 发明人 SHIMIZU DAISUKE;SUGITA HIKARU;MATSUMURA NOBUJI;KAI TOSHIYUKI;SHIMOKAWA TSUTOMU
分类号 G03F7/00;G03F7/004;G03F7/075;G03F7/40 主分类号 G03F7/00
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