发明名称 Polish pad conditioning in mechanical polishing systems
摘要 A mechanical polishing apparatus includes a polishing pad, at least one carrier head positioned over and off center relative to the polishing pad and configured for holding at least one substrate against the polishing pad within a first annular region of the polishing pad when the polishing pad is rotating. At least one conditioning head is positionable over and off center relative the polishing pad at a plurality of first positions and configured for applying a contacting surface of at least one conditioning pad against the polishing pad when the polishing pad is rotating, where the conditioning pad is applied to a second annular region of the polishing pad and moves between the plurality of first positions. In the apparatus, the diameter of the conditioning pad≦̸a difference between a radius of the polishing pad and a width of the first annular region.
申请公布号 US8172647(B2) 申请公布日期 2012.05.08
申请号 US20080274140 申请日期 2008.11.19
申请人 DAVIS EUGENE C.;BASIM GUL BAHAR;TEXAS INSTRUMENTS INCORPORATED 发明人 DAVIS EUGENE C.;BASIM GUL BAHAR
分类号 B24B1/00 主分类号 B24B1/00
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