BY-DIRECTIONAL ELECTRIC CONDUCTIVE SHEET, SEMICONDUCTOR TEST SOCKET USING THE SAME, AND MANUFACTURING METHOD THEREOF

摘要

PURPOSE: A bidirectional conductive sheet, a semi conductor test socket, and a manufacturing method thereof are provided to greatly reduce the production costs of the semiconductor test socket which is used for inspection. CONSTITUTION: A base structure unit(13a) includes a 3D net shaped structure. A conductive metal layer(13b) is spread over the entire surface of the base structure unit. An insulating elastic unit(13c) is provided by an electric insulating material. The insulating elastic unit fills the empty space of the 3D net shaped structure.