发明名称 STRUCTURE DEFORMATION MEASUREMENT SYSTEM AND METHOD
摘要 PURPOSE: A structure variation measuring system and method thereof are provided to can always measure a displacement in any external circumstances all the time because point positions can be inside of a screen by controlling a direction of the lasers irradiated for measuring a displacement of a structure. CONSTITUTION: A structure variation measuring system and method thereof comprise a laser scanner(413), a second laser scanner(423), a first camera(415), a second camera(425), and a control module. The first laser scanner is installed in a first structure and projects a laser beam to a second screen(421) attached on a second structure. The second laser scanner is installed in the second structure and projects the laser beam to a first screen(411) attached on the first structure. The first camera takes a photograph of the first screen, thereby creating a first image. The second camera takes a photograph of the second screen, thereby creating a second image. The control module controls a glancing angle of the first laser scanner so that the projected laser beam from the first laser scanner is projected to inside of the second screen. The control module controls a glancing angle of the second laser scanner so that the projected laser beam from the second laser scanner is projected to inside of the first screen. The control module presumes a relative displacement of the first structure with respect to the second structure by using the first and second images.
申请公布号 KR20120043502(A) 申请公布日期 2012.05.04
申请号 KR20100104837 申请日期 2010.10.26
申请人 KOREA ADVANCED INSTITUTE OF SCIENCE AND TECHNOLOGY 发明人 MYEONG, HYEON;JEAN, HEA MIN
分类号 G01B11/16 主分类号 G01B11/16
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