发明名称 |
DATA ERROR CHECK CIRCUIT, DATA ERROR CHECK METHOD, DATA TRANSMISSION METHOD USING DATA ERROR CHECK FUNCTION, SEMICONDUCTOR MEMORY APPARATUS AND MEMORY SYSTEM USING DATA ERROR CHECK FUNCTION |
摘要 |
Various embodiments of a memory system are disclosed. In one exemplary embodiment, the memory system may include a semiconductor memory apparatus configured to generate error check signals in a column direction and a row direction of data groups to be transmitted through a plurality of data input/output terminals in a read operation and output the error check signals together with the data groups, and a memory controller configured to control data read/write operations of the semiconductor memory apparatus, generate error check signals by performing error check in a column direction and a row direction of data groups to be transmitted in a write operation, and provide the error check signals to the semiconductor memory apparatus together with the data groups. |
申请公布号 |
US2012110398(A1) |
申请公布日期 |
2012.05.03 |
申请号 |
US20100970869 |
申请日期 |
2010.12.16 |
申请人 |
LEE JOONG HO;HYNIX SEMICONDUCTOR INC. |
发明人 |
LEE JOONG HO |
分类号 |
G11C29/04;G06F11/22 |
主分类号 |
G11C29/04 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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