发明名称 AMORPHOUS GE/TE DEPOSITION PROCESS
摘要 Germanium, tellurium, and/or antimony precursors are usefully employed to form germanium-, tellurium- and/or antimony-containing films, such as films of GeTe, GST, and thermoelectric germanium-containing films. Processes for using these precursors to form amorphous films are also described. Further described is the use of [{nBuC(iPrN)2}2Ge] or Ge butyl amidinate to form GeTe smooth amorphous films for phase change memory applications.
申请公布号 US2012108038(A1) 申请公布日期 2012.05.03
申请号 US201213346701 申请日期 2012.01.09
申请人 CHEN PHILIP S.H.;HUNKS WILLIAM;CHEN TIANNIU;STENDER MATTHIAS;XU CHONGYING;ROEDER JEFFREY F.;LI WEIMIN;ADVANCED TECHNOLOGY MATERIALS, INC. 发明人 CHEN PHILIP S.H.;HUNKS WILLIAM;CHEN TIANNIU;STENDER MATTHIAS;XU CHONGYING;ROEDER JEFFREY F.;LI WEIMIN
分类号 H01L21/205 主分类号 H01L21/205
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