PURPOSE: A method for forming a semiconductor device is provided to improve picture quality of a digital image by including a junction profile of a photodiode area and a feature size of a transfer gate structure. CONSTITUTION: A semiconductor substrate(2) including a first area and a second area is prepared. A first insulation layer(15) and a first conductive layer(22) are formed on the semiconductor substrate. A first structure(53) is formed on the first conductive layer within the first area. A second structure(55) is formed on the first conductive layer within the second area. A foreign material diffusion area(75) is formed by injecting foreign material ion within the semiconductor substrate.
申请公布号
KR20120041874(A)
申请公布日期
2012.05.03
申请号
KR20100103256
申请日期
2010.10.22
申请人
SAMSUNG ELECTRONICS CO., LTD.
发明人
CHOI, JONG WON;YANG, JUN SEOK;CHEON, KEON YONG;YOON, SUNG HYUN