发明名称 CONTACT STRUCTURE FOR REDUCING GATE RESISTANCE AND METHOD OF MAKING THE SAME
摘要 A semiconductor device having a gate on a substrate with source/drain (S/D) regions adjacent to the gate. A first dielectric layer overlays the gate and the S/D regions, the first dielectric layer having first contact holes over the S/D regions with first contact plugs formed of a first material and the first contact plugs coupled to respective S/D regions. A second dielectric layer overlays the first dielectric layer and the first contact plugs. A second contact hole formed in the first and second dielectric layers is filled with a second contact plug formed of a second material. The second contact plug is coupled to the gate and interconnect structures formed in the second dielectric layer, the interconnect structures coupled to the first contact plugs. The second material is different from the first material, and the second material has an electrical resistance lower than that of the first material.
申请公布号 US2012104471(A1) 申请公布日期 2012.05.03
申请号 US20100913982 申请日期 2010.10.28
申请人 CHANG CHUNG-LONG;CHAO CHIH-PING;CHEN CHUN-HUNG;TSENG HUA-CHAO;CHENG JYE-YEN;CHUANG HARRY-HAK-LAY;TAIWAN SEMICONDUCTOR MANUFACTURING COMPANY, LTD. 发明人 CHANG CHUNG-LONG;CHAO CHIH-PING;CHEN CHUN-HUNG;TSENG HUA-CHAO;CHENG JYE-YEN;CHUANG HARRY-HAK-LAY
分类号 H01L29/78;H01L21/336 主分类号 H01L29/78
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