发明名称 IIIOxNy ON REO/Si
摘要 An insulative layer on a semiconductor substrate and a method of fabricating the structure includes the steps of depositing a single crystal layer of rare earth oxide on a semiconductor substrate to provide electrical insulation and thermal management. The rare earth oxide is crystal lattice matched to the substrate. A layer of single crystal IIIOxNy is formed in overlying relationship on the rare earth oxide by transitioning from the layer of rare earth oxide to a single crystal layer of IIIOxNy within a one wafer single epitaxial process. In the preferred embodiment the substrate is silicon, the rare earth oxide is Gd2O3, and the IIIOxNy includes AlOxNy.
申请公布号 US2012104567(A1) 申请公布日期 2012.05.03
申请号 US201113208371 申请日期 2011.08.12
申请人 发明人 CLARK ANDREW;ARKUN ERDEM;LEBBY MICHAEL
分类号 H01L29/06;H01L21/31 主分类号 H01L29/06
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