发明名称 SCANNING ELECTRON MICROSCOPE DEVICE, EVALUATION POINT GENERATING METHOD, AND PROGRAM
摘要 An image acquisition condition necessary to so arrange FOV's as not to overlap along a device shape so that all constituent arreas necessary for electric characteristic measurement may be confined in the FOV's is determined from device shape information (including circuit design data and layout design data) possessed by CAD data. Since, contingently upon the shape of a wiring portion, the wiring portion of a device is expressed by using a plurality of basic constituent figures in combination, a process of arranging FOV's to the individual constituent figures is executed. For a cell portion, a FOV is arranged in reference to a cell outer frame and apexes. At that time, any apex is a starting point of the FOV arrangement process and another apex is an end point of the same process.
申请公布号 US2012104251(A1) 申请公布日期 2012.05.03
申请号 US201013322394 申请日期 2010.05.25
申请人 KAWASAKI TAKAHIRO 发明人 KAWASAKI TAKAHIRO
分类号 H01J37/26;G01N23/00 主分类号 H01J37/26
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