发明名称 |
IMPEDANCE CALIBRATION CIRCUIT AND SEMICONDUCTOR APPARATUS USING THE SAME |
摘要 |
An impedance calibration circuit includes: a first calibration unit configured to compare a first converted voltage obtained by converting a first calibration signal with a reference voltage and vary the first calibration signal; a voltage detection unit configured to activate a voltage detection signal according to a level of a power supply voltage; a multiplexing unit configured to select and output the reference voltage or the first converted voltage in response to the detection signal; and a second calibration unit configured to compare a second converted voltage obtained by converting a second calibration signal with the level of the output signal of the multiplexing unit and vary the second calibration signal. |
申请公布号 |
US2012105100(A1) |
申请公布日期 |
2012.05.03 |
申请号 |
US201213342547 |
申请日期 |
2012.01.03 |
申请人 |
KIM KI HO;HYNIX SEMICONDUCTOR INC. |
发明人 |
KIM KI HO |
分类号 |
H03K19/003 |
主分类号 |
H03K19/003 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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