BURN-IN DEVICE, BURN-IN SYSTEM, METHOD OF CONTROLLING BURN-IN DEVICE, AND METHOD OF CONTROLLING BURN-IN SYSTEM

摘要

PURPOSE: A burn-in device, a burn-in system, a method for controlling the burn-in device, and a method for controlling the burn-in system are provided to reduce a test time. CONSTITUTION: A test control apparatus(100) comprises a test pattern output circuit(210) and a device selection signal output circuit(220). The device selection signal output circuit outputs a device selection signal in a burn-in board. The test pattern output circuit outputs test pattern data provided to the device under test in the burn-in board. The device selection signal output circuit has a mask setting memory. The device selection signal output circuit prevents the selection of the device under test specified to mask configuration data.