发明名称 DEAD PIXEL COMPENSATION TESTING APPARATUS
摘要 A dead pixel compensating apparatus includes, inter alia, a pattern generation unit generating a programmable test pattern including data with respect to at least one dead pixel; a register array storing the test pattern; a dead pixel compensation unit receiving the test pattern stored in the register array and performing a dead pixel compensation algorithm to output compensation data; and a determination unit comparing the test pattern and the compensation data to determine whether or not the dead pixel compensation algorithm has an error, wherein a dead pixel compensation algorithm for compensating for a dead pixel of an image sensor in image data supplied from the image sensor is tested.
申请公布号 US2012105648(A1) 申请公布日期 2012.05.03
申请号 US201113273321 申请日期 2011.10.14
申请人 KIM GEON PYO;KIM JONG PARK;KIM MYOUNG KWAN;HYNIX SEMICONDUCTOR INC. 发明人 KIM GEON PYO;KIM JONG PARK;KIM MYOUNG KWAN
分类号 H04N17/00 主分类号 H04N17/00
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