发明名称 Waveform Sampling System
摘要 1,160,970. Circuit testing. TEXAS INSTRUMENTS Inc. Aug.24, 1966 [Dec. 7, 1965], No. 37971/66. Heading G1U. The description repeats a large part of that in Specification 1,160, 969), especially that part concerned with the sampling system used in making dynamic tests. The claims are particularly directed to this sampling system.
申请公布号 GB1160970(A) 申请公布日期 1969.08.13
申请号 GB19660037971 申请日期 1966.08.24
申请人 TEXAS INSTUMENTS INCORPORATED 发明人
分类号 G01R31/28;G01R31/3193 主分类号 G01R31/28
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