发明名称 Multi-path interference light measuring method and apparatus
摘要 <p>Power of multi-path interference light is measured by setting the cycle of pulse modulation for a light source in correspondence with the length of an optical medium of a target(13) to be measured, by inputting pulse light after being modulated to the target(13) to be measured, by modulating (14) the pulse signal light output from the target (13) to be measured with the use of a pulse signal for modulation having the same cycle as the set cycle, and by observing the wavelength dependency of the power of the light after being modulated. In this way, a modulation condition is set according to a condition of a target(13) to be measured when multi-path interference light caused by double Rayleigh scattering light or reflection at the end of a connector is measured with a pulse-OSA method, so that measurement accuracy is improved. <IMAGE></p>
申请公布号 EP1351046(B1) 申请公布日期 2012.05.02
申请号 EP20030001356 申请日期 2003.01.24
申请人 FUJITSU LIMITED 发明人 MURO, SHINICHIROU;SUGAYA, YASUSHI
分类号 G01M11/00;G01M11/02 主分类号 G01M11/00
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