发明名称 Method of manufacturing SOI substrate
摘要 The method of one embodiment of the present invention includes: a first step of irradiating a bond substrate with ions to form an embrittlement region in the bond substrate; a second step of bonding the bond substrate to a base substrate with an insulating layer therebetween; a third step of splitting the bond substrate at the embrittlement region to form a semiconductor layer over the base substrate with the insulating layer therebetween; and a fourth step of subjecting the bond substrate split at the embrittlement region to a first heat treatment in an argon atmosphere and then a second heat treatment in an atmosphere of a mixture of oxygen and nitrogen to form a reprocessed bond substrate. The reprocessed bond substrate is used again as a bond substrate in the first step.
申请公布号 US8168481(B2) 申请公布日期 2012.05.01
申请号 US20100762675 申请日期 2010.04.19
申请人 HANAOKA KAZUYA;TSUYA HIDEKI;NAGAI MASAHARU;SEMICONDUCTOR ENERGY LABORATORY CO., LTD. 发明人 HANAOKA KAZUYA;TSUYA HIDEKI;NAGAI MASAHARU
分类号 H01L21/00;H01L21/20;H01L21/30;H01L21/46 主分类号 H01L21/00
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