发明名称 Appearance inspection apparatus
摘要 An appearance inspection apparatus analyzes a difference in detection characteristics of detection signals obtained by detectors to flexibly meet various inspection purposes without changing a circuit or software. The apparatus includes a signal synthesizing section that synthesizes detection signals from the detectors in accordance with a set condition. An input operating section sets a synthesizing condition of the detection signal by the signal synthesizing section, and an information display section displays a synthesizing map structured based on a synthesized signal which is synthesized by the signal synthesizing section in accordance with a condition set by the input operating section.
申请公布号 US8169606(B2) 申请公布日期 2012.05.01
申请号 US20100823290 申请日期 2010.06.25
申请人 OKA KENJI;MATSUI SHIGERU;HITACHI HIGH-TECHNOLOGIES CORPORATION 发明人 OKA KENJI;MATSUI SHIGERU
分类号 G01N21/00;G01N21/956 主分类号 G01N21/00
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