发明名称 Refresh control circuit and method for semiconductor memory apparatus
摘要 A refresh control circuit of a semiconductor memory apparatus includes: a variable oscillator configured to generate a room-temperature oscillation signal and a limit-temperature oscillation signal in response to a temperature state signal; a cycle selector configured to selectively output the room temperature oscillation signal and the limit-temperature oscillation signal as a variable oscillation signal in response to the temperature state signal; a refresh signal generator configured to generate a refresh signal in response to the variable oscillation signal and a fixed oscillation signal; and a temperature state detector configured to generate the temperature state signal by detecting current temperature in response to the room-temperature oscillation signal and the fixed oscillation signal.
申请公布号 US8169846(B2) 申请公布日期 2012.05.01
申请号 US20090651043 申请日期 2009.12.31
申请人 CHUNG WON KYUNG;HYNIX SEMICONDUCTOR INC. 发明人 CHUNG WON KYUNG
分类号 G11C7/04 主分类号 G11C7/04
代理机构 代理人
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