发明名称 |
Memory built-in self-characterization |
摘要 |
A memory circuit includes an operational memory and a monitor circuit comprising a circuit element in the operational memory and/or a circuit element substantially identical to a corresponding circuit element in the operational memory. The monitor circuit is operative to measure at least one functional characteristic of the operational memory. A control circuit coupled to the monitor circuit is operative to generate a control signal which varies as a function of the measured characteristic of the operational memory. The memory circuit further includes a programmable voltage source coupled to the operational memory which is operative to generate at least a voltage and/or a current supplied to at least a portion of the operational memory which varies as a function of the control signal. |
申请公布号 |
US8169844(B2) |
申请公布日期 |
2012.05.01 |
申请号 |
US20090494718 |
申请日期 |
2009.06.30 |
申请人 |
AZIMI KOUROS;FRATTI ROGER A.;GEORGE DANNY MARTIN;MCPARTLAND RICHARD J.;AGERE SYSTEMS INC. |
发明人 |
AZIMI KOUROS;FRATTI ROGER A.;GEORGE DANNY MARTIN;MCPARTLAND RICHARD J. |
分类号 |
G11C7/00 |
主分类号 |
G11C7/00 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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