发明名称 |
Method for evaluating SRAM memory cell and computer readable recording medium which records evaluation program of SRAM memory cell |
摘要 |
A method for evaluating an SRAM memory cell in which the time required for designing the SRAM memory cell can be shortened by evaluating static noise margin in a shortened time. A recording medium which records an evaluation program is also provided. The coordinate conversion which rotates the coordinate axis by 45 degrees is applied to the input/output characteristic data of a first inverter of the SRAM memory cell, and the first proximity curve function is specified by fitting the input/output characteristic data of the first inverter to the proximity curve. The coordinate conversion which rotates the coordinate axis by 45 degrees is applied to the input/output characteristic data of a second inverter of the SRAM memory cell, and the second proximity curve function is specified by fitting the input/output characteristic data of the second inverter to the proximity curve. A third proximity curve function which is a function generated by mirror-inverting the second proximity curve function with respect to the Y axis is specified, and a static noise margin is specified based on an extremal value of a difference curve function which is the difference between the first proximity curve function and the third proximity curve function. |
申请公布号 |
US8169813(B2) |
申请公布日期 |
2012.05.01 |
申请号 |
US20080594048 |
申请日期 |
2008.03.10 |
申请人 |
NAKAMURA KAZUYUKI;KOIKE HIROKI;KYUSHU INSTITUTE OF TECHNOLOGY |
发明人 |
NAKAMURA KAZUYUKI;KOIKE HIROKI |
分类号 |
G11C11/00 |
主分类号 |
G11C11/00 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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