发明名称 Fabricating method for forming integrated structure of IGBT and diode
摘要 An integrated structure of an IGBT and a diode includes a plurality of doped cathode regions, and a method of forming the same is provided. The doped cathode regions are stacked in a semiconductor substrate, overlapping and contacting with each other. As compared with other doped cathode regions, the higher a doped cathode region is disposed, the larger implantation area the doped cathode region has. The doped cathode regions and the semiconductor substrate have different conductive types, and are applied as a cathode of the diode and a collector of the IGBT. The stacked doped cathode regions can increase the thinness of the cathode, and prevent the wafer from being overly thinned and broken.
申请公布号 US8168480(B2) 申请公布日期 2012.05.01
申请号 US20090563172 申请日期 2009.09.21
申请人 LIN WEI-CHIEH;CHEN HO-TAI;YEH JEN-HAO;LIN LI-CHENG;HUNG SHIH-CHIEH;ANPEC ELECTRONICS CORPORATION 发明人 LIN WEI-CHIEH;CHEN HO-TAI;YEH JEN-HAO;LIN LI-CHENG;HUNG SHIH-CHIEH
分类号 H01L21/332 主分类号 H01L21/332
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