发明名称 Semiconductor devices including first and second silicon interconnection regions
摘要 Provided are a semiconductor device and a method of fabricating the same. The semiconductor device includes a first interconnection disposed on a substrate. The interconnection includes a first silicon interconnection region and a first metal interconnection region sequentially stacked on the substrate. A second interconnection includes a second silicon interconnection region and a second metal interconnection region that are stacked sequentially. The second silicon interconnection region has a lower resistivity than the first silicon interconnection region.
申请公布号 US8169074(B2) 申请公布日期 2012.05.01
申请号 US20100827375 申请日期 2010.06.30
申请人 PARK JONG-MAN;YAMADA SANTORU;SAMSUNG ELECTRONICS CO., LTD. 发明人 PARK JONG-MAN;YAMADA SANTORU
分类号 H01L23/48 主分类号 H01L23/48
代理机构 代理人
主权项
地址