发明名称 Methods of forming one transistor DRAM devices
摘要 A one transistor DRAM device includes: a substrate with an insulating layer, a first semiconductor layer provided on the insulating layer and including a first source region and a first region which are in contact with the insulating layer and a first floating body between the first source region and the first drain region, a first gate pattern to cover the first floating body, a first interlayer dielectric to cover the first gate pattern, a second semiconductor layer provided on the first interlayer dielectric and including a second source region and a second drain region which are in contact with the first interlayer dielectric and a second floating body between the second source region and the second drain region, and a second gate pattern to cover the second floating body.
申请公布号 US8168530(B2) 申请公布日期 2012.05.01
申请号 US20100842703 申请日期 2010.07.23
申请人 JEONG JAE-HUN;KIM KI-NAM;JUNG SOON-MOON;JANG JAE-HOON;SAMSUNG ELECTRONICS CO., LTD. 发明人 JEONG JAE-HUN;KIM KI-NAM;JUNG SOON-MOON;JANG JAE-HOON
分类号 H01L21/4763 主分类号 H01L21/4763
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