发明名称 MULTI-LAYER POLISHING PAD MATERIAL FOR CMP
摘要 The invention is directed to a multi-layer polishing pad for chemical-mechanical polishing comprising a porous polishing layer and a porous bottom layer, wherein the bottom layer is substantially coextensive with the polishing layer, the polishing layer being joined to the bottom layer without the use of an adhesive; the polishing layer having an average surface roughness, Ra, that is greater than the Ra of the bottom layer.
申请公布号 IL186687(A) 申请公布日期 2012.04.30
申请号 IL20070186687 申请日期 2007.10.16
申请人 CABOT MICROELECTRONICS CORPORATION 发明人
分类号 B24B7/30;B24B37/20;B24B37/22;B24D3/32;B24D13/14 主分类号 B24B7/30
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