发明名称 MAGNETIC SYSTEM FOR ABSOLUTE FORCE MEASURMENT WITH IMPROVED LINEARITY
摘要 <p>The object of the invention is a magnetic system for absolute force measurement with improved linearity. That force is therefore the input and the electric signal is an output. The magnetic system consists of: magnetic field probe (103, 203) that measures absolute magnetic field, first permanent magnet (102,202) with a fixed position relative to the magnetic field probe (103, 203) and second permanent magnet (101, 201) that changes its position according to the applied force (107, 207).</p>
申请公布号 SI23519(A) 申请公布日期 2012.04.30
申请号 SI20100000306 申请日期 2010.10.05
申请人 UNIVERZA V LJUBLJANI, FAKULTETA ZA ELEKTROTEHNIKOLABORATORIJ ZA MIKROELEKTRONIKO 发明人 TRONTELJ JANEZ;SMID BLAZ
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