TEST HANDLER FOR CHIP LED

摘要

PURPOSE: A chip-shaped led test handler is provided to improve productivity due to reduction of a tact time by organic advances of processes including LED supply, test, classification, and discharge. CONSTITUTION: A chip-shaped led test handler comprises a test index(100), a rotary classifying index(200), a fixed type discharge mechanism(600), and a feeding mechanism(400). The test index has the structure of a rotatable turn table for supplying LED along the radial direction and executes test processes for LED by a probe unit. The rotary classifying index is adjacent to the test index and has the rotatable turntable structure. The rotary classifying index classifies the test process-completed LED the probe unit. The fixed type discharge mechanism discharges LED from the rotary classifying index side. The feeding mechanism is placed between the test index and the rotary classifying index.