发明名称 |
CHEMICAL MECHANICAL POLISHING LIQUID |
摘要 |
<p>Disclosed is a chemical mechanical polishing liquid for the planarization of a blocking layer, which comprises at least one kind of abrasive particle, a metal chelating agent, a silicon dioxide polishing promoter, a composite metal anticorrosive, an auxiliary cleaning constituent and an oxidant. During polishing of the blocking layer, the polishing liquid can effectively remove particle residues on the surface of wafers and metal compound residues on polishing pads, and has relatively good stability.</p> |
申请公布号 |
WO2012051787(A1) |
申请公布日期 |
2012.04.26 |
申请号 |
WO2011CN01454 |
申请日期 |
2011.08.29 |
申请人 |
ANJI MICROELECTRONICS (SHANGHAI) CO., LTD.;SONG, PETER, WEIHONG;YAO, DAISY, YING |
发明人 |
SONG, PETER, WEIHONG;YAO, DAISY, YING |
分类号 |
C09G1/02 |
主分类号 |
C09G1/02 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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