发明名称 SEMICONDUCTOR DEVICE AND METHOD OF MANUFACTURING THE SAME
摘要 <P>PROBLEM TO BE SOLVED: To provide a semiconductor device having a silicon film that is formed by polysilicon, has a steep impurity concentration profile, and has a flat top surface, and to provide a method of manufacturing the same. <P>SOLUTION: A method of manufacturing a semiconductor device comprises a step of forming a silicon film. The step of forming the silicon film includes a first step of depositing amorphous silicon, and a second step of producing silicon crystal grains with the deposition of the amorphous silicon, and of setting the deposition rate of the amorphous silicon higher than the growth rate of the silicon crystal grains. <P>COPYRIGHT: (C)2012,JPO&INPIT
申请公布号 JP2012084813(A) 申请公布日期 2012.04.26
申请号 JP20100231911 申请日期 2010.10.14
申请人 TOSHIBA CORP 发明人 IWAKAJI YOKO;HIROTA JUN;YABUKI SO;ISHIDA KOICHI;KAI WAKANA;MIZUSHIMA ICHIRO
分类号 H01L27/105;H01L45/00;H01L49/00 主分类号 H01L27/105
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