发明名称 TIMING GENERATOR AND SEMICONDUCTOR TESTING APPARATUS
摘要 A timing generator that needs no analog circuit for adding jitters and allows the circuit scale and power consumption to be reduced. There are included a counter for performing a counting operation synchronized with a reference clock signal: a timing memory for outputting respective data corresponding to the quotient and remainder resulting from dividing the time from the front of a basic period until a generation of a timing edge by the period of the reference clock signal: a coincidence detecting circuit for outputting a signal that exhibits a high level when the count value of the counter coincides with the quotient: a jitter generating circuit for outputting as a jitter amplitude value: adders for adding a time corresponding to the remainder and a time represented by the jitter amplitude value outputted from the jitter generating circuit: and a variable delay circuit for delaying the output signal from the coincidence detecting circuit by the time represented by the addition result of the adders and outputting the delayed output signal.
申请公布号 KR101139141(B1) 申请公布日期 2012.04.26
申请号 KR20067025384 申请日期 2005.06.06
申请人 发明人
分类号 G01R31/3183;G01R31/317;G01R31/319 主分类号 G01R31/3183
代理机构 代理人
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