| 摘要 |
A test probe with a dual switching probe tip includes an insulating sheath, a conductive wire and a complex probe tip, and an end of the conductive wire is passed and connected into the insulating sheath. The complex probe tip includes a connecting section, and a first measuring head and a second measuring head extended in opposite directions from both ends of the connecting section respectively, and the first and second measuring heads are measuring heads of two different specifications and electrically connected with each other, and the connecting section is selectively combined with the insulating sheath, and the first measuring head is exposed from the insulating sheath or accommodated in the insulating sheath and electrically connected to the conductive wire. The probe tip can be switched and installed at the insulating sheath to extend the using life of the test probe or meet the requirements of fitting different specifications. |
