发明名称 DIFFERENTIAL PHASE-CONTRAST IMAGING
摘要 <p>The present invention relates to differential phase-contrast imaging, in particular to a structure of a diffraction grating, e.g. an analyzer grating and a phase grating, for X-ray differential phase-contrast imaging. In order to make better use of the X-ray radiation passing the object, a diffraction grating (14) for X-ray differential phase-contrast imaging is provided with at least one portion (24) of a first sub-area (26) and at least one portion (28) of a second sub-area (30). The first sub-area comprises a grating structure (54) with a plurality of bars (34) and gaps (36) being arranged periodically with a first grating pitch P G (38), wherein the bars are arranged such that thy change the phase and/or amplitude of an X-ray radiation and wherein the gaps are X-ray transparent. The second sub-area is X-ray transparent and wherein the at least one portion of the second sub-area provides an X-ray 1 transparent aperture (40) in the grating. Portions of the first and second sub-areas are arranged in an alternating manner in at least one direction (42).</p>
申请公布号 WO2012052881(A1) 申请公布日期 2012.04.26
申请号 WO2011IB54500 申请日期 2011.10.12
申请人 KONINKLIJKE PHILIPS ELECTRONICS N.V.;PHILIPS INTELLECTUAL PROPERTY & STANDARDS GMBH;ROESSL, EWALD 发明人 ROESSL, EWALD
分类号 G01N23/04;A61B6/06;G01N23/20;G21K1/06 主分类号 G01N23/04
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