发明名称 SURFACE STATE INSPECTION DEVICE, SURFACE STATE INSPECTION METHOD AND PROGRAM
摘要 <P>PROBLEM TO BE SOLVED: To accurately detect a fault regardless of the shape of a surface of an inspection object and the fault. <P>SOLUTION: Two or more kinds of pattern lights having at least cross-shaped and ring-shaped irradiation patterns produced on a surface of an inspection object are emitted on the surface of the inspection object from a light-emitting portion 601. The pattern lights are emitted on the surface of the inspection object while scanning in a predetermined direction. On the other hand, an imaging portion 602 shoots an image including the irradiation pattern produced by the emitted pattern lights, and an image processing portion 603 detects a fault on the surface of the inspection object on the basis of changes of the shape of the irradiation pattern included in the shot image. <P>COPYRIGHT: (C)2012,JPO&INPIT
申请公布号 JP2012083211(A) 申请公布日期 2012.04.26
申请号 JP20100229715 申请日期 2010.10.12
申请人 CANON INC 发明人 HOSHINO KATSUYUKI
分类号 G01N21/88;G01B11/30 主分类号 G01N21/88
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