发明名称 METHOD OF FABRICATING SEMICONDUCTOR DEVICE
摘要 A method of fabricating a semiconductor device includes sequentially forming a first gate insulating layer and a second gate insulating layer on a substrate, implanting impurity ions into the substrate and performing a first thermal process for activating the impurity ions to form a source and drain region, and forming a third gate insulating layer on the substrate after the first thermal process has been completed.
申请公布号 US2012100684(A1) 申请公布日期 2012.04.26
申请号 US201113280430 申请日期 2011.10.25
申请人 MIN JI-YOUNG;SHIN YU-GYUN;NAM GAB-JIN;KIM YOUNG-PIL;SAMSUNG ELECTRONICS CO., LTD. 发明人 MIN JI-YOUNG;SHIN YU-GYUN;NAM GAB-JIN;KIM YOUNG-PIL
分类号 H01L21/336;B82Y40/00 主分类号 H01L21/336
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