| 摘要 |
<P>PROBLEM TO BE SOLVED: To provide a detection method and detection device for wafer level LED chips and transparent probe card thereof. <P>SOLUTION: A transparent probe card is provided and covers a wafer for electrically connecting the testing pads of the LED chips via the contacts so as to perform a light-up test on the LED chips. When the LED chips are lighted up, an imaging process is performed on the light signals of the LED chips to form an image on a sensing element. The image is captured, and the image signal is converted into optical field information and position information corresponding to each of the LED chips. The spectrums and the luminous intensities of the LED chips are obtained according to the optical field information of the LED chips. The LED chips are classified according to the spectrums and the luminous intensities of the LED chips. <P>COPYRIGHT: (C)2012,JPO&INPIT |
