发明名称 APPARATUS AND METHOD FOR COMPENSATION OF VARIABILITY IN CHEMICAL MECHANICAL POLISHING CONSUMABLES
摘要 Apparatus and methods for conditioning a polishing pad in a CMP system are provided. In one embodiment, an apparatus for polishing a substrate is provided. The apparatus includes a rotatable platen and a conditioner device coupled to a base. The conditioner device includes a shaft rotatably coupled to the base by a first motor. A rotatable conditioner head is coupled to the shaft by an arm. The conditioner head coupled to a second motor controlling rotation of the conditioner head. One or more measurement devices are provided that are operable to sense a rotational force metric of the shaft relative to the base and a rotational force metric of the conditioner head.
申请公布号 WO2012054149(A2) 申请公布日期 2012.04.26
申请号 WO2011US51251 申请日期 2011.09.12
申请人 APPLIED MATERIALS, INC.;DHANDAPANI, SIVAKUMAR;JAIN, ASHEESH;GARRETSON, CHARLES C.;MENK, GREGORY, E.;TSAI, STAN, D. 发明人 DHANDAPANI, SIVAKUMAR;JAIN, ASHEESH;GARRETSON, CHARLES C.;MENK, GREGORY, E.;TSAI, STAN, D.
分类号 H01L21/304;H01L21/66 主分类号 H01L21/304
代理机构 代理人
主权项
地址