发明名称 SEMICONDUCTOR DEVICE
摘要 <P>PROBLEM TO BE SOLVED: To provide a semiconductor device that can inhibit reduction of current detection accuracy. <P>SOLUTION: A gate electrode of a main Tr2 and a gate electrode of a sense Tr3 are connected to a common gate terminal which applies a gate voltage. And, a gate potential from the gate terminal is directly applied to the sense Tr3 while a potential obtained from dividing the gate potential by a first and a second resistances 31, 32 is applied to the main Tr2 such that a gate-source voltage of the main Tr2 and a gate-source voltage of the sense Tr3 become equal to each other. <P>COPYRIGHT: (C)2012,JPO&INPIT
申请公布号 JP2012084625(A) 申请公布日期 2012.04.26
申请号 JP20100228237 申请日期 2010.10.08
申请人 DENSO CORP 发明人 ITO HITOSHI;AKAGI NOZOMI;TOMATSU YUTAKA;SAKAKIBARA TOSHIO
分类号 H01L27/04;H01L21/822;H01L29/78;H03F3/343 主分类号 H01L27/04
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