发明名称 |
ABRASIVE, CONCENTRATED 1-LIQUID SYSTEM ABRASIVE, 2-LIQUID SYSTEM ABRASIVE, AND SUBSTRATE POLISHING METHOD |
摘要 |
<P>PROBLEM TO BE SOLVED: To provide: an abrasive, for CMP of a film to be polished such as a silicon oxide system insulator film, capable of polishing a film to be polished to high flatness while suppressing polishing scratches; concentrated 1-liquid system and 2-liquid system abrasives to obtain the abrasive; and a polishing method using the abrasive. <P>SOLUTION: The abrasive contains: tetravalent metal hydroxide particles; cationizing polyvinyl alcohol; at least one kind of saccharide selected from a group composed of amino sugar, derivatives of the amino sugar, polysaccharide having amino sugar and derivatives of the polysaccharide; acid component; and water. The substrate polishing method is provided with a process to polish a silicon oxide film 2 by supplying the abrasive between a silicon oxide film (a film to be polished) 2 formed on a silicone substrate 1 and a polish pad. <P>COPYRIGHT: (C)2012,JPO&INPIT |
申请公布号 |
JP2012084906(A) |
申请公布日期 |
2012.04.26 |
申请号 |
JP20110273645 |
申请日期 |
2011.12.14 |
申请人 |
HITACHI CHEM CO LTD |
发明人 |
RYUZAKI DAISUKE;NARITA TAKENORI;HOSHI YOSUKE;IWANO TOMOHIRO |
分类号 |
H01L21/304;B24B37/00;B24B37/04 |
主分类号 |
H01L21/304 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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