发明名称 ABRASIVE, CONCENTRATED 1-LIQUID SYSTEM ABRASIVE, 2-LIQUID SYSTEM ABRASIVE, AND SUBSTRATE POLISHING METHOD
摘要 <P>PROBLEM TO BE SOLVED: To provide: an abrasive, for CMP of a film to be polished such as a silicon oxide system insulator film, capable of polishing a film to be polished to high flatness while suppressing polishing scratches; concentrated 1-liquid system and 2-liquid system abrasives to obtain the abrasive; and a polishing method using the abrasive. <P>SOLUTION: The abrasive contains: tetravalent metal hydroxide particles; cationizing polyvinyl alcohol; at least one kind of saccharide selected from a group composed of amino sugar, derivatives of the amino sugar, polysaccharide having amino sugar and derivatives of the polysaccharide; acid component; and water. The substrate polishing method is provided with a process to polish a silicon oxide film 2 by supplying the abrasive between a silicon oxide film (a film to be polished) 2 formed on a silicone substrate 1 and a polish pad. <P>COPYRIGHT: (C)2012,JPO&INPIT
申请公布号 JP2012084906(A) 申请公布日期 2012.04.26
申请号 JP20110273645 申请日期 2011.12.14
申请人 HITACHI CHEM CO LTD 发明人 RYUZAKI DAISUKE;NARITA TAKENORI;HOSHI YOSUKE;IWANO TOMOHIRO
分类号 H01L21/304;B24B37/00;B24B37/04 主分类号 H01L21/304
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