发明名称 INTEGRATED CIRCUIT TECHNOLOGY WITH DIFFERENT DEVICE EPITAXIAL LAYERS
摘要 A semiconductor die includes a substrate, a first device region and a second device region. The first device region includes an epitaxial layer on the substrate and one or more semiconductor devices of a first type formed in the epitaxial layer of the first device region. The second device region is spaced apart from the first device region and includes an epitaxial layer on the substrate and one or more semiconductor devices of a second type formed in the epitaxial layer of the second device region. The epitaxial layer of the first device region is different than the epitaxial layer of the second device region so that the one or more semiconductor devices of the first type are formed in a different epitaxial layer than the one or more semiconductor devices of the second type.
申请公布号 US2012098083(A1) 申请公布日期 2012.04.26
申请号 US20100911009 申请日期 2010.10.25
申请人 MEYER THORSTEN;WERNER WOLFGANG;KADOW CHRISTOPH;INFINEON TECHNOLGIES AG 发明人 MEYER THORSTEN;WERNER WOLFGANG;KADOW CHRISTOPH
分类号 H01L29/00;H01L21/20 主分类号 H01L29/00
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