| 摘要 |
<P>PROBLEM TO BE SOLVED: To monitor a latchup of IGBT elements using a detection current Is which is proportional to a main current Im in an IGBT chip 10 which comprises IGBT elements 44 and 45 for the output of the main current Im and the detection current Is, and to save space of an adjustment resistance and reduce man-hours of the work, while enabling a ratio of Is to Im to be adjustable to a design value with respect to variations in production. <P>SOLUTION: An adjustment resistance portion 60 for adjusting a resistance value between an original electrode 16 which outputs Is and a sense pad 17 is formed along with a shorting metal layer 67. The shorting metal layer 67 has a parallel connection portion with respect to each resistor 64 of the adjustment resistance portion 60, by which it shorts both terminals of each of the resistors 64 together. When the parallel connection portion is cut off by trimming by laser, the resistors 64 have their shorted terminals released to become functioning as resistive elements of the adjustment resistance portion 60. The resistance value of the adjustment resistance portion 60 depends on the connection relationship of the resistors 64 as resistive elements and their resistance values. <P>COPYRIGHT: (C)2012,JPO&INPIT |
