| 摘要 |
<P>PROBLEM TO BE SOLVED: To measure with high accuracy the shape of a measurement target whose shape change is sudden or discontinuous, with a less number of projection patterns. <P>SOLUTION: A three-dimensional shape measurement apparatus which measures a three-dimensional shape of a measurement target in a measurement space comprises: pattern projection means for projecting patterns having brightness changes in a measurement space; image pick-up means for picking up an image of the measurement space in which a pattern is projected; local disposition information calculation means for calculating local disposition information of the pattern from the brightness change of the pattern in the picked-up image obtained by the image pick-up means; defocusing amount calculation means for calculating the defocusing amount of the pattern in the picked-up image; and three-dimensional shape calculation means for calculating a three dimensional-image of the measurement target based on the local disposition information and the defocusing amount. <P>COPYRIGHT: (C)2012,JPO&INPIT |
